JPH0234146B2 - - Google Patents
Info
- Publication number
- JPH0234146B2 JPH0234146B2 JP60104796A JP10479685A JPH0234146B2 JP H0234146 B2 JPH0234146 B2 JP H0234146B2 JP 60104796 A JP60104796 A JP 60104796A JP 10479685 A JP10479685 A JP 10479685A JP H0234146 B2 JPH0234146 B2 JP H0234146B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- holder
- receiver
- exchange device
- sample exchange
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000523 sample Substances 0.000 claims description 106
- 239000012520 frozen sample Substances 0.000 claims description 12
- 230000000149 penetrating effect Effects 0.000 claims description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 8
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 238000002844 melting Methods 0.000 description 4
- 230000008018 melting Effects 0.000 description 4
- 239000012472 biological sample Substances 0.000 description 3
- 238000001704 evaporation Methods 0.000 description 3
- 238000007789 sealing Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000008020 evaporation Effects 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 238000001816 cooling Methods 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000000386 microscopy Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60104796A JPS61263037A (ja) | 1985-05-16 | 1985-05-16 | 凍結試料交換装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60104796A JPS61263037A (ja) | 1985-05-16 | 1985-05-16 | 凍結試料交換装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61263037A JPS61263037A (ja) | 1986-11-21 |
| JPH0234146B2 true JPH0234146B2 (en]) | 1990-08-01 |
Family
ID=14390407
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60104796A Granted JPS61263037A (ja) | 1985-05-16 | 1985-05-16 | 凍結試料交換装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61263037A (en]) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5099499B2 (ja) * | 2007-11-07 | 2012-12-19 | 独立行政法人理化学研究所 | サンプルピン保持アタッチメント |
| CN120265969A (zh) * | 2022-11-29 | 2025-07-04 | 国立大学法人大阪大学 | 冷冻装置、显微镜、冷冻方法、以及观察方法 |
-
1985
- 1985-05-16 JP JP60104796A patent/JPS61263037A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61263037A (ja) | 1986-11-21 |
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